- vom 3.3.2022
- vom 14.7.2021
Ultrahigh vacuum scanning-tunneling microscope for in situ studies of annealing and electromigration behavior of thin films
In: Journal of Vacuum Science and Technology, B: Microelectronics and Nanometer Structures, Jg. 11 H. 1, S. 108-111Thickness-dependent thin-film resistivity: application of quantitative scanning-tunneling-microscopy imaging
In: Physical review B, Jg. 43 H. 6, S. 5176-5179Thickness-dependent effects in the work function of polycrystalline Cu-Films
In: Europhysics letters, Jg. 9 H. 4, S. 379-384Thickness dependence of the work function in double-layer metallic films
In: Zeitschrift für Physik, B: Condensed Matter, Jg. 77 H. 3, S. 399-407The influence of surface roughness on electronic transport in thin films
In: Surface science, Jg. 269-270, S. 772-776Substrate effects on the surface topography of evaporated gold films: a scanning tunnelling microscopy investigation
In: Surface science, Jg. 218 H. 1, S. 108-126STM on polycrystalline thin films
In: Vacuum, Jg. 41 H. 4-6, S. 1322-1324