80 Titel in Klassifikation (DDC) → Naturwissenschaften und Mathematik → Physik 1
zu den Filteroptionen80 Titel in Klassifikation (DDC) → Naturwissenschaften und Mathematik → Physik
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- Alle Titel
- Klassifikation (DDC)
- Naturwissenschaften und Mathematik
- Physik
- Physik
- Klassische Mechanik; Festkörpermechanik
- Mechanik der Fluide; Mechanik der Flüssigkeiten
- Gasmechanik
- Schall und verwandte Schwingungen
- Licht, Infrarot- und Ultraviolettphänomene
- Wärme
- Elektrizität, Elektronik
- Magnetismus
- Moderne Physik
Anomalous Hall Effect and Magnetoresistance in Sputter-Deposited Magnetic Weyl Semimetal Co2TiGe Thin Films
In: Physica status solidi B-Basic solid state phsyics, Jg. 258 H. 12021
Appearance of flat surface bands in three-dimensional topological insulators in a ferromagnetic exchange field
In: New Journal of Physics, Jg. 16 H. 32014Application of magnetic multiple resonance techniques to the study of point defects in solids
In: Electronic Magnetic Resonance of the Solid State (CSC symposium series : 1 ), Jg. 1987, S. 503-5192009Application of magnetic multiple resonances to study defects in III-V compounds
In: Crystal Latice Defects and Amorphous Materials, Jg. 1989, S. 281-2952009Application of magnetic resonance techniques to the study of defects in solids
In: Determination of structural features of crystalline and amorphous solids (Physical methods of chemistry : 5), Jg. 1990, S. 433-5162009Application of modern magnetic resonance techniques to the characterization of point defects in semi-insulating III-V semiconductors
In: Semi-insulating III - V Materials: Hakone 1986, Jg. 1986, S. 299-3042009Application of multiline two-photon microscopy to functional in vivo imaging
In: Journal of Neuroscience Methods, Jg. 151 H. 2, S. 276-2862006Application of novel analysis workflows in an ATLAS search for supersymmetry
Wuppertal, 10.03.2021
Application of optically detected magnetic resonance to the characterization of point defects in semiconductors
In: International Conference on Defects in Semiconductors : Proceedings of the International Conference on Defects in Semiconductors. (Materials Science Forum 10-12), Jg. 1986, S. 505-5142009
An applied noise model for scintillation-based CCD detectors in transmission electron microscopy
In: scientific reports, 15, Artikel-ID 3815, Seite 1-37Paderborn : Universitätsbibliothek, 2025Applying live job monitoring techniques to Monte Carlo validation
Wuppertal, November 19, 2016Aspects of quark mass dependence in lattice QCD
Wuppertal, [2020]