Scanning tunneling potentiometry (STP) studies of gold islands on a thin carbon film
Besold, J. ; Reiss, Günter ; Hoffmann, HorstIn: Applied surface science, Jg. 65-66, S. 23-27Growth and structure of polycrystalline Cr/Au multilayered thin films
Brückl, Hubert ; Vancea, Johann ; Lecheler, R. ; Reiss, Günter ; Hoffmann, HorstIn: Thin solid films, Jg. 250 H. 1-2, S. 56-60On/off switching of bit readout in bias-enhanced tunnel magneto-Seebeck effect
Böhnke, Alexander ; Milnikel, Marius ; von der Ehe, Marvin ; Franz, Christian ; Zbarsky, Vladyslav ; Czerner, Michael ; Rott, Karsten ; Thomas, Andy ; Heiliger, Christian ; Reiss, Günter ; Münzenberg, MarkusIn: Scientific Reports, Jg. 5 H. 1Anomalous Hall Effect and Magnetoresistance in Sputter-Deposited Magnetic Weyl Semimetal Co2TiGe Thin Films
Dyck, Denis ; Becker, Andreas ; Koo, Jungwoo ; Matalla-Wagner, Tristan ; Krieft, Jan ; Reiss, GünterIn: Physica status solidi B-Basic solid state phsyics, Jg. 258 H. 1Electronic transport properties and thickness dependence of the giant magnetoresistance in Co/Cu multilayers
Eckl, Th. ; Reiss, Günter ; Brückl, Hubert ; Hoffmann, HorstIn: Journal of applied physics, Jg. 75 H. 1, S. 362-367Thickness dependence of the work function in double-layer metallic films
Hornauer, Hans ; Vancea, Johann ; Reiss, Günter ; Hoffmann, HorstIn: Zeitschrift für Physik, B: Condensed Matter, Jg. 77 H. 3, S. 399-407Electronic transport properties of giant-magnetoresistance Fe/Cr multilayers
Jacob, M. ; Reiss, Günter ; Brückl, Hubert ; Hoffmann, HorstIn: Physical Review, B, Jg. 46 H. 17, S. 11208-11211Absence of intrinsic electric conductivity in single dsDNA molecules
Kleine, Hermann ; Wilke, Ralf ; Pelargus, Christoph ; Rott, Karsten ; Pühler, Alfred ; Reiss, Günter ; Ros, Robert ; Anselmetti, DarioIn: Journal of Biotechnology, Jg. 112 H. 1-2, S. 91-95In situ scanning-tunneling-microscopy studies of current driven mass transport in Ag
Levine, L. E. ; Reiss, Günter ; Smith, D. A.In: Journal of applied physics, Jg. 74 H. 9, S. 5476-5482In situ scanning-tunneling-microscopy studies of early-stage electromigration in Ag
Levine, L. E. ; Reiss, Günter ; Smith, D. A.In: Physical Review, B, Jg. 48 H. 2, S. 858-863Sign change in the tunnel magnetoresistance of Fe3O4/MgO/Co-Fe-B magnetic tunnel junctions depending on the annealing temperature and the interface tr [...]
Marnitz, Luca ; Rott, Karsten ; Niehörster, Stefan ; Klewe, Christoph ; Meier, Daniel ; Fabretti, Savio ; Witziok, Matthäus ; Krampf, Andreas ; Kuschel, Olga ; Schemme, Tobias ; Kuepper, Karsten ; Wollschläger, Joachim ; Thomas, Andy ; Reiss, Günter ; Kuschel, TimoIn: AIP Advances, Jg. 5 H. 4Quantitative separation of the anisotropic magnetothermopower and planar Nernst effect by the rotation of an in-plane thermal gradient
Reimer, Oliver ; Meier, Daniel ; Bovender, Michel ; Helmich, Lars ; Dreessen, Jan-Oliver ; Krieft, Jan ; Shestakov, Anatoly S. ; Back, Christian H. ; Schmalhorst, Jan-Michael ; Hütten, Andreas ; Reiss, Günter ; Kuschel, TimoIn: Scientific Reports, Jg. 7 H. 1Electronic transport in metallic films: a tool for scanning tunneling microscopy investigations
Reiss, Günter ; Brückl, HubertIn: Superlattices and Microstructures, Jg. 11 H. 2, S. 171-174The influence of surface roughness on electronic transport in thin films
Reiss, Günter ; Brückl, HubertIn: Surface science, Jg. 269-270, S. 772-776Scanning tunneling microscopy on rough surfaces: quantitative image analysis
Reiss, Günter ; Brückl, Hubert ; Vancea, Johann ; Lecheler, R. ; Hastreiter, E.In: Journal of applied physics, Jg. 70 H. 1, S. 523-525Thickness-dependent thin-film resistivity: application of quantitative scanning-tunneling-microscopy imaging
Reiss, Günter ; Hastreiter, E. ; Brückl, Hubert ; Vancea, JohannIn: Physical review B, Jg. 43 H. 6, S. 5176-5179Ultrahigh vacuum scanning-tunneling microscope for in situ studies of annealing and electromigration behavior of thin films
Reiss, Günter ; Levine, L. E. ; Smith, D. A.In: Journal of Vacuum Science and Technology, B: Microelectronics and Nanometer Structures, Jg. 11 H. 1, S. 108-111Scanning tunneling microscopy on rough surfaces: deconvolution of constant current images
Reiss, Günter ; Schneider, F. ; Vancea, Johann ; Hoffmann, HorstIn: Applied physics letters, Jg. 57 H. 9, S. 867-869Grain boundary resistance in polycrystalline metals
Reiss, Günter ; Vancea, Johann ; Hoffmann, HorstIn: Physical review letters, Jg. 56 H. 19, S. 2100-2103