Experimental symmetry analysis of energy bands near critical points in Pt using spin- and momentum-resolved photoemission
Oepen, H. P. ; Hünlich, K. ; Kirschner, J. ; Eyers, A. ; Schäfers, F. ; Schönhense, G. ; Heinzmann, UlrichIn: Physical Review B: Condensed Matter and Materials Physics, Jg. 31 H. 10, S. 6846-6848Experimental verification of a new spin-polarization effect in photoemission: Polarized photoelectrons from Pt(111) with linearly polarized radiation in [...]
Schmiedeskamp, B. ; Vogt, B. ; Heinzmann, UlrichIn: Physical review letters, Jg. 60 H. 7, S. 651-654Experimental verification of a spin effect in photoemission: Polarized electrons due to phase-shift differences in the normal emission from Pt(100) by [...]
Irmer, N. ; David, R. ; Schmiedeskamp, B. ; Heinzmann, UlrichIn: Physical Review B: Condensed Matter and Materials Physics, Jg. 45 H. 7, S. 3849-3852Fabrication and characterization of Si-based soft x-ray mirrors
Schmiedeskamp, B. ; Heidemann, B. ; Kleineberg, U. ; Kloidt, A. ; Kühne, M. ; Müller, H. ; Müller, P. ; Nolting, K. ; Heinzmann, Ulrich ; Hoover, Richard B. (Hrsg.)In: X-ray EUV optics for astronomy, microscopy, polarimetry, and projection lithography, Jg. 1343, S. 64-72Hg 5d and 6s: Multichannel quantum-defect analysis of experimental data
Schäfers, F. ; Heckenkamp, Ch. ; Müller, M. ; Radojevic, V. ; Heinzmann, UlrichIn: Physical Review, A: Atomic, Molecular and Optical Physics, Jg. 42 H. 5, S. 2603-2613A high flux normal incidence monochromator for circularly polarized synchrotron radiation
Eyers, A. ; Heckenkamp, Ch. ; Schäfers, F. ; Schönhense, G. ; Heinzmann, UlrichIn: Nuclear Instruments and Methods in Physics Research, Jg. 208 H. 1-3, S. 303-305High resolution Rutherford backscattering spectroscopy studies on Mo/Si multilayers
Heidemann, B. ; Tappe, T. ; Schmiedeskamp, B. ; Heinzmann, UlrichIn: Thin Solid Films, Jg. 228 H. 1-2, S. 60-63High-flux normal incidence monochromator for circularly polarized synchrotron radiation
Schäfers, F. ; Peatman, W. ; Eyers, A. ; Heckenkamp, Ch. ; Schönhense, G. ; Heinzmann, UlrichIn: Review of Scientific Instruments, Jg. 57 H. 6, S. 1032-1041Highly Spin-Polarized Photoemission near Threshold from Physisorbed Xenon and Krypton Atoms
Schönhense, G. ; Eyers, A. ; Friess, U. ; Schäfers, F. ; Heinzmann, UlrichIn: Physical review letters, Jg. 54 H. 6, S. 547-550Identification of Xe interface states in the Xe(111)/Pt(111) system by spin-resolved photoelectron spectroscopy
Kessler, B. ; Müller, Norbert ; Schmiedeskamp, B. ; Heinzmann, UlrichIn: Solid State Communications, Jg. 90 H. 8, S. 523-526Influence of autoionisation and predissociation on the photoelectron parameters in HBr
Lefebvre-Brion, H. ; Salzmann, M. ; Klausing, H.-W. ; Müller, M. ; Böwering, N. ; Heinzmann, UlrichIn: Journal of Physics B: Atomic, Molecular and Optical Physics, Jg. 22 H. 23, S. 3891-3900Influence of orientation on coadsorption dynamics: CO displacement from a c(2×2) precovered Ni(100) surface by free oriented NO
Müller, H. ; Dierks, B. ; Fecher, G. H. ; Böwering, N. ; Heinzmann, UlrichIn: Journal of Chemical Physics, Jg. 101 H. 8, S. 7154-7160Influence of temperature and of physisorbed Xe/Kr on the spin resolved photoemission from Pt(111)
Eyers, A. ; Schönhense, G. ; Friess, U. ; Schäfers, F. ; Heinzmann, UlrichIn: Surface Science, Jg. 162 H. 1-3, S. 96-102Interface Stability and Silicide Formation in High Temperature Stable MoxSi1-x/Si Multilayer Soft X-Ray Mirrors Studied by Means of X-Ray Diffraction and [...]
Kleineberg, U. ; Stock, H. J. ; Kloidt, A. ; Schmiedeskamp, B. ; Heinzmann, Ulrich ; Hopfe, S. ; Scholz, R.In: Physica status solidi A: applications and materials science, Jg. 145 H. 2, S. 539-550Interlayer composition and interface stability in Mo/Si multilayers studied with high-resolution RBS
Heidemann, B. ; Tappe, T. ; Schmiedeskamp, B. ; Heinzmann, UlrichIn: Applied Surface Science, Jg. 78 H. 2, S. 133-140A laser-based coherent VUV source and its application to highly resolved studies of the Fano effect in HI
Huth-Fehre, T. ; Mank, A. ; Drescher, Markus ; Böwering, N. ; Heinzmann, UlrichIn: Physica Scripta, Jg. 41 H. 4, S. 454-457A laser-generated plasma as a source of VUV continuum radiation for photoelectronic spectroscopy
Heckenkamp, Ch. ; Heinzmann, Ulrich ; Schönhense, G. ; Burgess, D. D. ; Thorne, A. P. ; Wheaton, J. E. G.In: Journal of Physics D: Applied Physics, Jg. 14 H. 12, S. L203-L206Measurements and calculations of the circular polarization and of the absolute intensity of synchrotron radiation in the wavelength range from 40 to 100 [...]
Heinzmann, Ulrich ; Osterheld, B. ; Schäfers, F.In: Nuclear Instruments and Methods in Physics Research, Jg. 195 H. 1-2, S. 395-398Mo 0,5 Si 0,5/Si multilayer soft x-ray mirrors, high thermal stability, and normal incidence reflectivity
Stock, H. J. ; Kleineberg, U. ; Kloidt, A. ; Schmiedeskamp, B. ; Heinzmann, Ulrich ; Krumrey, M. ; Müller, P. ; Scholze, F.In: Applied Physics Letters, Jg. 63 H. 16, S. 2207-2209Multimass thermal desorption spectroscopy as a monitoring device for chemical reaction products
Zagatta, Gunther ; Müller, H. ; Böwering, N. ; Heinzmann, UlrichIn: Review of Scientific Instruments, Jg. 65 H. 2, S. 359-362