277 Titel in Klassifikation (DDC) → Naturwissenschaften und Mathematik → Physik 2
zu den Filteroptionen277 Titel in Klassifikation (DDC) → Naturwissenschaften und Mathematik → Physik
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- Alle Titel
- Klassifikation (DDC)
- Naturwissenschaften und Mathematik
- Physik
- Physik
- Klassische Mechanik; Festkörpermechanik
- Mechanik der Fluide; Mechanik der Flüssigkeiten
- Gasmechanik
- Schall und verwandte Schwingungen
- Licht, Infrarot- und Ultraviolettphänomene
- Wärme
- Elektrizität, Elektronik
- Magnetismus
- Moderne Physik
Absence of intrinsic electric conductivity in single dsDNA molecules
In: Journal of Biotechnology, Jg. 112 H. 1-2, S. 91-952004
Achieving high effective Q-factors in ultra-high vacuum dynamic force microscopy
In: Measurement Science and Technology, Jg. 21 H. 122010Adsorption of dodecanethiol on Cu(110): Structural ordering upon thiolate formation
In: Langmuir, Jg. 18 H. 14, S. 5558-55652002Advanced algorithms for the simulation of Gauge theories with dynamical fermionic degrees of freedom
Wuppertal : Fachbereich Physik, BUGH Wuppertal, 2001
'All-inclusive' imaging of the rutile TiO2(110) surface using NC-AFM
In: Nanotechnology, Jg. 20 H. 50, S. 505703 ff.2009Analysis of non-forward quark quark correlator
Wuppertal : Fachbereich Physik, Berg. Univ., Gesamthochsch. Wuppertal, 2001Anchoring of organic molecules to a metal surface: HtBDC on Cu(110)
In: Physical Review Letters, Jg. 86 H. 3, S. 456-4592001Application of magnetic multiple resonance techniques to the study of point defects in solids
In: Electronic Magnetic Resonance of the Solid State (CSC symposium series : 1 ), Jg. 1987, S. 503-5192009Application of magnetic multiple resonances to study defects in III-V compounds
In: Crystal Latice Defects and Amorphous Materials, Jg. 1989, S. 281-2952009Application of magnetic resonance techniques to the study of defects in solids
In: Determination of structural features of crystalline and amorphous solids (Physical methods of chemistry : 5), Jg. 1990, S. 433-5162009Application of modern magnetic resonance techniques to the characterization of point defects in semi-insulating III-V semiconductors
In: Semi-insulating III - V Materials: Hakone 1986, Jg. 1986, S. 299-3042009Application of multiline two-photon microscopy to functional in vivo imaging
In: Journal of Neuroscience Methods, Jg. 151 H. 2, S. 276-2862006Application of optically detected magnetic resonance to the characterization of point defects in semiconductors
In: International Conference on Defects in Semiconductors : Proceedings of the International Conference on Defects in Semiconductors. (Materials Science Forum 10-12), Jg. 1986, S. 505-5142009