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An applied noise model for scintillation-based CCD detectors in transmission electron[...]
Beam correlations and the reconstruction of the detector PSF
Gaussian noise
Poisson noise
Noise correlation effects
Noise and convolution
The noise model
Signal and detector noise
Processing operations
Dark frame subtraction
The acquisition of a gain reference
The application of a gain reference
Gain non-linearities
Binning of the detector
Evaluation of the noise model
Detector noise
Binning of detector noises
Signal and fixed-pattern noise
The fixed-pattern noise of the gain reference
The brighter-fatter effect
Correction of gain non-linearities
Binning of signal and fixed-pattern noises
Beam correlations and the reconstruction of the detector PSF
Theoretical considerations on STEM-EELS measurements
Conclusions
References
Journal Article
An applied noise model for scintillation-based CCD detectors in transmission electron microscopy / Christian Zietlow & Jörg K. N. Lindner
Place and Date of Creation
Paderborn
2025
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