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An applied noise model for scintillation-based CCD detectors in transmission electron[...]
Gaussian noise
Poisson noise
Noise correlation effects
Noise and convolution
The noise model
Signal and detector noise
Processing operations
Dark frame subtraction
The acquisition of a gain reference
The application of a gain reference
Gain non-linearities
Binning of the detector
Evaluation of the noise model
Detector noise
Binning of detector noises
Signal and fixed-pattern noise
The fixed-pattern noise of the gain reference
The brighter-fatter effect
Correction of gain non-linearities
Binning of signal and fixed-pattern noises
Beam correlations and the reconstruction of the detector PSF
Theoretical considerations on STEM-EELS measurements
Conclusions
References
Aufsatz in einer Zeitschrift
An applied noise model for scintillation-based CCD detectors in transmission electron microscopy / Christian Zietlow & Jörg K. N. Lindner
Entstehung
Paderborn
2025
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