Substrate effects on the surface topography of evaporated gold films: a scanning tunnelling microscopy investigation
Vancea, Johann ; Reiss, Günter ; Schneider, F. ; Bauer, K. ; Hoffmann, HorstIn: Surface science, Jg. 218 H. 1, S. 108-1261989Thickness dependence of the work function in double-layer metallic films
Hornauer, Hans ; Vancea, Johann ; Reiss, Günter ; Hoffmann, HorstIn: Zeitschrift für Physik, B: Condensed Matter, Jg. 77 H. 3, S. 399-4071989Thickness-dependent effects in the work function of polycrystalline Cu-Films
Vancea, Johann ; Reiss, Günter ; Butz, D. ; Hoffmann, HorstIn: Europhysics letters, Jg. 9 H. 4, S. 379-3841989Thickness-dependent thin-film resistivity: application of quantitative scanning-tunneling-microscopy imaging
Reiss, Günter ; Hastreiter, E. ; Brückl, Hubert ; Vancea, JohannIn: Physical review B, Jg. 43 H. 6, S. 5176-51791990Ultrahigh vacuum scanning-tunneling microscope for in situ studies of annealing and electromigration behavior of thin films
Reiss, Günter ; Levine, L. E. ; Smith, D. A.In: Journal of Vacuum Science and Technology, B: Microelectronics and Nanometer Structures, Jg. 11 H. 1, S. 108-1111993