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Comment on "Reinterpretation of the thickness-dependent conductivity of thin platinum films"
Vancea, Johann ; Reiss, Günter ; Hoffmann, HorstIn: Journal of Materials Science Letters, Jg. 6 H. 8, S. 985-9861987Electrical conduction in low-resistivity (quasiamorphous) Ag1-xCux alloys
Vancea, Johann ; Pukowietz, S. ; Reiss, Günter ; Hoffmann, HorstIn: Physical Review , B, Jg. 35 H. 17, S. 9067-90721987Electronic transport properties and thickness dependence of the giant magnetoresistance in Co/Cu multilayers
Eckl, Th. ; Reiss, Günter ; Brückl, Hubert ; Hoffmann, HorstIn: Journal of applied physics, Jg. 75 H. 1, S. 362-3671994Electronic transport properties of giant-magnetoresistance Fe/Cr multilayers
Jacob, M. ; Reiss, Günter ; Brückl, Hubert ; Hoffmann, HorstIn: Physical Review, B, Jg. 46 H. 17, S. 11208-112111992Grain boundary resistance in polycrystalline metals
Reiss, Günter ; Vancea, Johann ; Hoffmann, HorstIn: Physical review letters, Jg. 56 H. 19, S. 2100-21031986Growth and structure of polycrystalline Cr/Au multilayered thin films
Brückl, Hubert ; Vancea, Johann ; Lecheler, R. ; Reiss, Günter ; Hoffmann, HorstIn: Thin solid films, Jg. 250 H. 1-2, S. 56-601994Mean-free-path concept in polycrystalline metals
Vancea, Johann ; Reiss, Günter ; Hoffmann, HorstIn: Physical Review , B, Jg. 35 H. 12, S. 6435-64371986Percolation threshold and mean grain size in AlxSi1-x thin films
Reiss, Günter ; Vancea, Johann ; Hoffmann, HorstIn: Journal of Physics, C: Solid State Physics, Jg. 18 H. 21, S. L657-L6601985Resistivity and the Hall effect in polycrystalline Ni-Cu and Ta-Cu multi-layered thin films
Reiss, Günter ; Vancea, Johann ; Kapfberger, Klaus ; Meier, G. ; Hoffmann, HorstIn: Journal of Physics, Condensed Matter, Jg. 1 H. 7, S. 1275-12831989Scanning tunneling microscopy on rough surfaces: deconvolution of constant current images
Reiss, Günter ; Schneider, F. ; Vancea, Johann ; Hoffmann, HorstIn: Applied physics letters, Jg. 57 H. 9, S. 867-8691990Scanning tunneling microscopy on rough surfaces: tip-shape-limited resolution
Reiss, Günter ; Vancea, Johann ; Wittmann, H. ; Zweck, Josef ; Hoffmann, HorstIn: Journal of applied physics, Jg. 67 H. 3, S. 1156-11591990Scanning tunneling potentiometry (STP) studies of gold islands on a thin carbon film
Besold, J. ; Reiss, Günter ; Hoffmann, HorstIn: Applied surface science, Jg. 65-66, S. 23-271993Substrate effects on the surface topography of evaporated gold films: a scanning tunnelling microscopy investigation
Vancea, Johann ; Reiss, Günter ; Schneider, F. ; Bauer, K. ; Hoffmann, HorstIn: Surface science, Jg. 218 H. 1, S. 108-1261989Thickness dependence of the work function in double-layer metallic films
Hornauer, Hans ; Vancea, Johann ; Reiss, Günter ; Hoffmann, HorstIn: Zeitschrift für Physik, B: Condensed Matter, Jg. 77 H. 3, S. 399-4071989Thickness-dependent effects in the work function of polycrystalline Cu-Films
Vancea, Johann ; Reiss, Günter ; Butz, D. ; Hoffmann, HorstIn: Europhysics letters, Jg. 9 H. 4, S. 379-3841989