Frequency-modulated atomic force microscopy operation by imaging at the frequency shift minimum: The dip-df mode
In: Review of Scientific Instruments, Jg. 85 H. 4, S. 43707 ff.2014
Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy
In: Beilstein Journal of Nanotechnology, Jg. 4, S. 32-442013