Comment on "Reinterpretation of the thickness-dependent conductivity of thin platinum films"
In: Journal of Materials Science Letters, Jg. 6 H. 8, S. 985-9861987
Electrical conduction in low-resistivity (quasiamorphous) Ag1-xCux alloys
In: Physical Review , B, Jg. 35 H. 17, S. 9067-90721987Grain boundary resistance in polycrystalline metals
In: Physical review letters, Jg. 56 H. 19, S. 2100-21031986Mean-free-path concept in polycrystalline metals
In: Physical Review , B, Jg. 35 H. 12, S. 6435-64371986Percolation threshold and mean grain size in AlxSi1-x thin films
In: Journal of Physics, C: Solid State Physics, Jg. 18 H. 21, S. L657-L6601985Resistivity and the Hall effect in polycrystalline Ni-Cu and Ta-Cu multi-layered thin films
In: Journal of Physics, Condensed Matter, Jg. 1 H. 7, S. 1275-12831989Scanning tunneling microscopy on rough surfaces: deconvolution of constant current images
In: Applied physics letters, Jg. 57 H. 9, S. 867-8691990Scanning tunneling microscopy on rough surfaces: tip-shape-limited resolution
In: Journal of applied physics, Jg. 67 H. 3, S. 1156-11591990Substrate effects on the surface topography of evaporated gold films: a scanning tunnelling microscopy investigation
In: Surface science, Jg. 218 H. 1, S. 108-1261989Thickness dependence of the work function in double-layer metallic films
In: Zeitschrift für Physik, B: Condensed Matter, Jg. 77 H. 3, S. 399-4071989Thickness-dependent effects in the work function of polycrystalline Cu-Films
In: Europhysics letters, Jg. 9 H. 4, S. 379-3841989Thickness-dependent thin-film resistivity: application of quantitative scanning-tunneling-microscopy imaging
In: Physical review B, Jg. 43 H. 6, S. 5176-51791990