Spin-polarized LEED from Xe-Pt(111)
Hilgers, G. ; Kleineberg, U. ; Nolting, K. ; Wirth, S. ; Müller, Norbert ; Heinzmann, UlrichIn: Vacuum, Jg. 41 H. 1-3, S. 325-3271990Interface Stability and Silicide Formation in High Temperature Stable MoxSi1-x/Si Multilayer Soft X-Ray Mirrors Studied by Means of X-Ray Diffraction and HRTEM
Kleineberg, U. ; Stock, H. J. ; Kloidt, A. ; Schmiedeskamp, B. ; Heinzmann, Ulrich ; Hopfe, S. ; Scholz, R.In: Physica status solidi A: applications and materials science, Jg. 145 H. 2, S. 539-5501994Enhancement of the reflectivity of Mo/Si multilayer x-ray mirrors by thermal treatment
Kloidt, A. ; Nolting, K. ; Kleineberg, U. ; Schmiedeskamp, B. ; Heinzmann, Ulrich ; Müller, P. ; Kühne, M.In: Applied Physics Letters, Jg. 58 H. 23, S. 2601-26031991Smoothing of interfaces in ultrathin Mo/Si multilayers by ion bombardment
Kloidt, A. ; Stock, H. J. ; Kleineberg, U. ; Döhring, T. ; Pröpper, M. ; Schmiedeskamp, B. ; Heinzmann, UlrichIn: Thin Solid Films, Jg. 228 H. 1-2, S. 154-1571993Fabrication and characterization of Si-based soft x-ray mirrors
Schmiedeskamp, B. ; Heidemann, B. ; Kleineberg, U. ; Kloidt, A. ; Kühne, M. ; Müller, H. ; Müller, P. ; Nolting, K. ; Heinzmann, Ulrich ; Hoover, Richard B. (Hrsg.)In: X-ray EUV optics for astronomy, microscopy, polarimetry, and projection lithography, Jg. 1343, S. 64-721991Thermal stability of Mo/Si multilayer soft-X-ray mirrors fabricated by electron-beam evaporation
Stock, H. J. ; Kleineberg, U. ; Heidemann, B. ; Hilgers, K. ; Kloidt, A. ; Schmiedeskamp, B. ; Heinzmann, Ulrich ; Krumrey, M. ; Müller, P. ; Scholze, F.In: Applied Physics A: Materials Science and Processing, Jg. 58 H. 4, S. 371-3761994Mo 0,5 Si 0,5/Si multilayer soft x-ray mirrors, high thermal stability, and normal incidence reflectivity
Stock, H. J. ; Kleineberg, U. ; Kloidt, A. ; Schmiedeskamp, B. ; Heinzmann, Ulrich ; Krumrey, M. ; Müller, P. ; Scholze, F.In: Applied Physics Letters, Jg. 63 H. 16, S. 2207-22091993