Inhalt

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   Abstract
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   Table of contents
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   Introduction
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   Principles of secondary ion massspectrometry
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  Generation of secondary ions
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   The sputtering process
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   Emission of secondary ions
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   Post-ionization of sputtered neutrals
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  Separation of secondary ions
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   Conventional SIMS
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   TOF-SIMS
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  Quantification
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   Element ratios
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   Isotopic ratios
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   Static and dynamic SIMS
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   Charge compensation
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   Mass interferences
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   Isobaric interferences from other nuclides
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   Hydrides
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   Oxides and hydroxides
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   Hydrocarbons
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   Mass resolution in time-of-flight mass spectrometry
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  Time-of-flight secondary ion mass spectrometry
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  Secondary ion mass spectrometers
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   DF-SIMS
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   TOF-SIMS
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   Description of the TOF-SIMS instrument
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   The argon primary ion source
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   The gallium primary ion source
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   Mass resolution – spatial resolution – signal intensity
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   Sputtering
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   TOF-SIMS mass spectra
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   Quantification
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   Linearity of the detector
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   Mass fractionation
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   Element analysis
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   Hydrogen
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   Lithium, beryllium, and boron
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   Carbon
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   Nitrogen
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   Oxygen
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   Fluorine, chlorine, bromine, and iodine
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   Sodium, potassium, rubidium, and cesium
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   Magnesium, calcium, strontium, and barium
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   Aluminum
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   Silicon
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   Phosphorous
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   Sulfur
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   Scandium, titanium, vanadium, and chromium
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   Manganese, iron, cobalt, and nickel
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   Copper and zinc
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   Gallium
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   Silver
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   Lanthanides
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   Lead
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   Other elements
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   SIMS sensitivities
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   Isotope analysis
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   Organic molecules
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   Data processing
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  Meteorites
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   Ca,Al-rich inclusions in carbonaceous chondrites
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   Organic molecules in Allan Hills 84001, Murchison, and Orgueil
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  Further meteorite studies with TOF-SIMS
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   Orgueil
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   Chassigny and Nakhla
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   Interplanetary dust
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   Volatile elements
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   Mineral identification
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   The collector project
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   Particle impact residues from space probes
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   Further TOF-SIMS studies
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  Presolar grains
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   Isotope measurements
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   Element mapping with TOF-SIMS
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   TOF-SIMS in space
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   Summary
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   Acknowledgements
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   References
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   Appendix