Biermanns, Andreas: X-ray diffraction from single GaAs nanowires. 2012
Inhalt
- Zusammenfassung
- Abstract
- Contents
- Glossary
- Introduction
- Semiconductor nanowires
- Kinematic x-ray diffraction
- Crystals and the reciprocal lattice
- X-ray diffraction from nanostructures
- Indexing reciprocal lattice points
- Experimental realization
- Coherent x-ray diffraction from GaAs nanowires grown by MOVPE
- Growth details and description of samples
- Average lattice parameters
- Individual variations probed by x-ray diffraction
- Microstructure of GaAs nanowires
- Discussion
- Structural evolution and relaxation of GaAS NWs on Si grown by MBE
- Introduction
- Ga-assisted NW growth
- Evolution of average structural composition
- Statistical distribution of zinc-blende twins and wurtzite segments
- Distribution of ZB and WZ phased along the growth direction
- Strain relaxation at the NW - substrate interface of single NWs
- Average strain release and interface structure
- Relaxation of thin nanowires
- Summary
- Strain in core-shell nanowire heterostructures
- Conclusions
- Structure factors of zinc-blende and wurtzite materials
- Resolution effects in reciprocal space maps
- Surface sensitive diffraction techniques
- Bibliography
- Acknowledgements