Kimmel, Nils: Analysis of the charge collection process in solid state X-ray detectors. 2008
Inhalt
- Kurzfassung
- Abstract
- Contents
- Overview
- 1 Introduction
- 1.1 Motivation
- 1.2 Basic semiconductor structures
- 1.3 X–ray photon detection in silicon
- 1.4 Charge storage and shift in three phase CCDs
- 1.5 pnCCD
- 2 pnCCD in detail
- 3 The mesh experiment
- 4 Measurements
- 5 ‘Mesh’ data analysis
- 5.1 Types of reconstructed pixel maps
- 5.2 Precision of the generated maps
- 5.3 Analysis of the pixel response
- 6 Device simulations
- 7 Comparison of device simulationsand analysis results
- 7.1 Evaluation of ccf simulations
- 7.2 Separation process of a charge cloud
- 7.3 Photon absorption in the front-side structure
- Conclusion
- List of Figures
- Bibliography
- Danksagung