Joshi, Siddharth: Fundamental studies of structure and crystallinity of low and high molecular weight poly(3-hexylthiophene) P3HT by means of synchrotron X-ray diffract [...]. 2008
Inhalt
- Table of Contents
- Abstract
- Abstrakt
- Introduction to the Problem – Scope and Outline of thisThesis
- 1 Polymer: An Introduction
- 1.1. Conjugated Polymer
- 1.2. Conjugated Polymers: Electronic Conductors
- 1.3. Polymer Field-Effect Transistor
- 1.4. Polythiophenes and Family
- 1.5. Charge Transport from Organic Materials
- 1.6. Phase Behavior and Polymer-Polymer Interface
- 1.7. References
- 2 X-ray Scattering Techniques
- 2.1. Introduction
- 2.2. Index of Refraction
- 2.3. X-ray Interaction with Matter
- 2.4. The Evanescent X-ray Wave
- 2.5. X-ray Reflectivity
- 2.6. X-ray Powder Diffraction
- 2.7. Diffractometer Recording of Powder Samples
- 2.8. Debye Scherrer Formula
- 2.9. Grazing Incidence Geometries
- 2.10. Grazing incidence Out-of-Plane Diffraction (GOD) Scans
- 2.11. Grazing Incidence Diffraction (GID) Scans
- 2.12. Distorted Wave Born Approximation for Grazing IncidenceScattering
- 2.13. Background Subtraction and Diffuse Scattering
- 2.14. Coherence Effects
- 2.15. Synchrotron Radiation Sources – Fundamental Operation
- 2.16. Advantage of Synchrotron Source
- 2.17. References
- 3 Methods and Experimental Details
- 3.1. ID 10B Beamline at ESRF
- 3.2. Experimental Set-up for X-ray Scattering Techniques
- 3.3. Sample Preparation
- 3.4. References
- 4 Room Temperature based X-ray Structure and Crystallinitystudies of LMW Poly (3-hexylthiophene) Fraction
- 4.1. Sample Preparation
- 4.2. Atomic Force Microscopy (AFM) Studies
- 4.3. Transmission Electron Microscopy (TEM) Studies
- 4.4. Determination of Layer Thickness
- 4.5. X-ray Grazing-Incidence Diffraction Studies
- 4.6. GID and GOD Studies at Room Temperature
- 4.7. Structure Model
- 4.8. Interface Induced Ordering
- 4.9. Discussion
- 4.10. References
- 5 Temperature Dependent Structural and Crystallinity Studiesof LMW Poly(3-hexylthiophene) by X-ray DiffractionMethods
- 5.1. Sample Preparation and Measurements Details
- 5.2. Temperature Dependent Reflectivity Measurements
- 5.3. Structure Investigation as a Function of Temperature
- 5.4. Influence of Film - Substrate Interaction & Thermal Expansion
- 5.5. Mobility Measurements
- 5.6. Discussion
- 5.7. References
- 6 Room Temperature Based X-ray Structure and CrystallinityStudies of HMW Poly(3-hexylthiophene)
- 6.1. Sample Preparation
- 6.2. Atomic Force Microscopy (AFM) Studies
- 6.3. Transmission Electron Microscopy Study
- 6.4. Determination of Layer Thickness
- 6.5. Differential Scanning Calorimetry
- 6.6. X-ray Grazing Incidence Diffraction Studies
- 6.7. Discussion
- 6.8. References
- 7 Temperature Dependent Structural and Crystallinity Studiesof HMW Poly(3-hexylthiophene) by X-ray DiffractionMethods
- 7.1. Sample Preparation
- 7.2. X-ray Grazing Incidence Diffraction Studies
- 7.3. Structure Investigation as a Function of Temperature
- 7.4. Depth Dependence Morphological Changes and Ordering
- 7.5. Depth Dependence Lamella Ordering for Thick and Thin Films
- 7.6. Mobility Measurements
- 7.7. Discussion
- 7.8. References
- Summary and Outlook
- Appendix
- Acknowledgement
- Curriculum Vitae
- Talks, List of Publications, Conferences