Keckert, Sebastian: Characterization of Nb3Sn and multilayer thin films for SRF applications. 2019
Inhalt
- Abstract
- Zusammenfassung
- Contents
- List of Figures
- List of Tables
- List of Abbreviations
- Introduction and Motivation
- Theory
- SRF Loss Mechanisms and Surface Resistance
- BCS Surface Resistance
- Residual Resistance
- Non-linear Surface Resistance
- Additional Resistance in Type-II Thin Film Structures
- Critical Fields and Field Limitations
- Ginzburg-Landau Theory
- Lower Critical Field
- Superheating Critical Field
- Vortex Line Nucleation
- Field Enhancement
- S-I-S' Layered Structures
- Instrumentation: The Quadrupole Resonator
- Overview and Mechanical Design
- Upgrade I: Operation at Higher Harmonic Quadrupole Modes
- Multi-mode Pickup Antenna
- Broad-band Phase-locked Loop RF Control System
- Operational Experience I: Frequency Shift and Mode Order Swapping
- Measuring RF Surface Resistance
- Calorimetric Measurement Technique
- Resolution, Accuracy and Precision
- Gradients of Temperature and RF Field
- Upgrade II: Sample Chamber Assembly and Extended Diagnostic Capabilities
- Measuring the RF Critical Field
- Uncertainty of RF Field Strength and Sample Temperature
- Systematic Error due to RF Heating
- Operational Experience II: Dynamic Detuning and Minimum Quench Time
- Measuring RF Penetration Depth
- RF Characterization of a Nb3Sn Sample
- Sample Preparation
- Surface Resistance Measurements
- Penetration Depth
- RF Critical Field
- SEM Investigation
- Summary
- RF Characterization of a NbTiN-AlN-Nb Sample
- Summary and Outlook
- Appendix
- QPR Mode Scans
- Antenna Coupling
- RF Gap Calibration
- Systematic Errors due to RF Field Dependent Surface Resistance
- Nb3Sn Penetration Depth Measurement at 846 MHz
- Residual Resistance Fits for the NbTiN-AlN-Nb Sample
- S-I-S' Baseline Penetration Depth Measurement
- Technical Details on Computer Simulations
- Bibliography
- Acknowledgements