Al Hassan, Ali: X-ray structural characterization of individual as-grown GaAs/(In,Ga)As/(GaAs) based core-multi-shell nanowires. 2019
Inhalt
- List of papers
- Acronyms
- Abstract
- Introduction
- Nanowires growth and structure
- Scanning modes used
- Reciprocal space mapping
- X-ray fluorescence nano-scale characterization
- Quick scanning X-ray diffraction microscopy
- Cathodoluminescence imaging
- Spatial indium distribution within the (In,Ga)As shell
- Introduction
- Experimental and computational details
- XRD and FEM results and discussion
- nXRF results and discussion
- Summary
- Structural characterization of individual as-grown core-shell nanowires
- Introduction and objective
- Samples
- XRD experimental setup
- Out-of-plane XRD
- In-plane XRD
- FEM modeling of the TRs
- Summary
- Structural and optical correlation of individual as-grown core-shell nanowires
- Beam damage of single semiconductor nanowires during X-ray nano beam diffraction experiment
- Conclusions
- Supplementary part of chapter 4
- Supplement 1: Scanning electron microscopy
- Supplement 2: Comparison of XRF intensities taken from different single NWs.
- Supplementary part of chapter 5
- Supplementary part of chapter 7
- Bibliography
- Acknowledgments