Ryll, Henning: Direct detection of electrons with the pnCCD for applications in transmission electron microscopy. 2017
Inhalt
- Title page
- Abstract
- Zusammenfassung
- Contents
- Acronyms
- 1 Introduction
- 2 Transmission Electron Microscopy
- 2.1 Wavelengths of Electrons in TEM
- 2.2 The Transmission Electron Microscope Instrument
- 2.3 Detectors for the Transmission Electron Microscope
- 2.4 Direct Electron Detectors
- 3 Interaction of Electrons With Matter
- 3.1 Inelastic Scattering of Electrons
- 3.2 Electron-hole Pair Generation
- 3.3 Energy Loss of Electrons in Matter
- 3.4 Path Length of Electron Tracks
- 3.5 Atomic Relaxation
- 3.6 Statistical Variation in the Generation of Signal Electrons
- 3.7 Elastic Scattering
- 3.8 Scattering Angles
- 3.9 Scattering of Electrons in the Sample
- 3.10 Scattering of Electron Waves
- 4 The pnCCD
- 4.1 The pnCCD Principle
- 4.2 Charge Spreading in the pnCCD
- 4.3 The Readout of the pnCCD
- 4.4 Charge Handling Capacity
- 4.5 Operation Modes of the pnCCD
- 4.6 The pnCCD TEM Camera System
- 5 Data Analysis Methods
- 5.1 Units of Energy in the Data Analysis
- 5.2 Raw Data Analysis
- 5.3 Intensity Imaging Mode
- 5.4 Event Imaging Mode
- 6 Simulation of Signal Generation by Electrons
- 6.1 Simulation Process
- 6.2 Simulation of Electron Tracks Results
- 6.3 Simulation of the Detection Efficiency
- 6.4 Statistical Considerations on the Number of Detectable Electrons
- 7 Signal Response to Electron Illumination
- 7.1 Energy Spectrum of the pnCCD under Electron Illumination
- 7.2 Pile-Up Events
- 7.3 Probability Distributions on Number of Pixels per Event
- 7.4 The Calibration Factor
- 7.5 The Conversion Factor
- 7.6 The Detective Quantum Efficiency
- 7.7 Energy Resolution of the pnCCD under Electron Illumination
- 7.8 Summary on the Signal Response
- 8 Spatial Resolution in Single Electron Imaging
- 8.1 Quantification of Spatial Resolution
- 8.2 Spatial Resolution in Intensity Imaging Mode
- 8.3 Point of Entry Models
- 8.4 Discussion of Models
- 9 Application of the pnCCD in Transmission Electron Microscopy
- 9.1 Demonstration of the Wave-Particle Duality of Electrons
- 9.2 Electron Tomography with the pnCCD
- 9.3 4D-STEM Imaging
- 9.4 Imaging Magnetic Domains
- 9.5 Lattice-Strain Measurement
- 9.6 Ptychography with the pnCCD
- 9.7 Summary of Applications
- 10 Conclusions
- A Appendix
- A.1 Modulation Transfer Function
- A.2 Detective Quantum Efficiency
- A.3 Intensity Distribution of Interference Pattern
- A.4 Calculation of Stopping Power
- A.5 Stopping Power and Electron Path Length
- A.6 The Landau Distribution Function
- A.7 Detection Efficiency Data
- A.8 Gauss Correction Code
- A.9 Gauss Correction Comparison
- A.10 Data Reference
- Bibliography
- List of Figures
- List of Tables
- List of Symbols
- Acknowledgments