Schmidt, Julia: A study of the charge collection, storage and processing in pixelated semiconductor detectors. 2017
Inhalt
- Abstract
- Zusammenfassung
- Contents
- 1 Introduction
- 2 Fundamentals of radiation detection
- 2.1 Basics of semiconductor detector physics
- 2.2 Interaction of electromagnetic radiation with matter
- 3 The pnCCD detector
- 4 Numerical device simulations
- 4.1 The drift-diffusion model
- 4.2 Modeling of the pnCCD pixel structure
- 4.3 Modelling of the charge collection process
- 5 Electric potential in the pnCCD pixel
- 5.1 Electric potential in the channel direction
- 5.2 Electric potential profile in the row direction
- 5.3 Electric potential in three-dimensional device simulations
- 6 Electric potential during charge collection
- 6.1 Influence of the operation parameters on the electric potential
- 6.2 Influence of the operation parameters on the pixel full well capacity
- 6.3 Effect of the space charge distribution
- 7 Electric potential profile during charge transfer
- 8 Controlled charge extraction
- 9 Experimental methods
- 10 Experimental and theoretical analysis of the pixel full well capacity
- 11 Analytical model of the charge handling capacity
- 12 Experimental verification of the pnCCD antiblooming mechanism
- 12.1 Charge drain in the pixel structure
- 12.2 Electric potential profile in antiblooming mode
- 12.3 Variation of the pixel charge drain level
- 13 Dynamic range of the on-chip electronics
- 13.1 Limitations of the on-chip electronics
- 13.2 Enhancing the dynamic range of the on-chip electronics
- 14 Spectrocopic properties
- 15 Application examples for enhanced dynamic range of the pnCCD
- 16 Conclusion
- Acronyms
- List of Figures
- List of Tables
- Bibliography