Jamshidifar, Mehran: On-wafer characterization of mm-wave and THz circuits using electrooptic sampling. 2016
Inhalt
- Title
- Abstract
- Zusammenfassung
- Related Publications
- Abbreviations
- Contents
- 1. Introduction
- 2. THz Waves and THz Electronics
- 2.1 THz waves and their applications
- 2.2 Photonic and optical based THz
- 2.3 Electronic THz sources
- 2.4 A short theory of NLTL and its THz range design considerations
- 2.5 THz detectors and sensors
- 3. Characterization of mm-Wave and THz Devices
- 4. Electrooptic Sampling Theory
- 5. Electrooptic Setup
- 5.1 Schematic diagram of the setup
- 5.2 Challenges using fiber-pigtailed probe
- 5.3 Modification of setup and using non-pigtailed probe
- 6. EOS Measurement of a 65-nm CMOSNLTL
- 6.1 DUT
- 6.2 EOS measurements
- 6.3 Simulation of a linear transmission line structure
- 6.4 Comparison between simulation and measurements
- 6.5 Measurement of an NLTL terminated with an on-chip antenna
- 7. Measurement Challenges, Errors, and Jitter
- 8. Laser Master-Laser Slave Synchronization
- 8.1 Mechanism of LM-LS synchronization
- 8.2 Providing the IF signal for superheterodyne LM-LS
- 8.3 Measurements with LM-LS
- 9. Optical Network Analysis Measurements
- 10. Photoconductive Probing vs. EOS
- 11. Conclusion
- Bibliography