- vom 3.3.2022
- vom 14.7.2021
Ultrahigh vacuum scanning-tunneling microscope for in situ studies of annealing and electromigration behavior of thin films
Reiss, Günter ; Levine, L. E. ; Smith, D. A.In: Journal of Vacuum Science and Technology, B: Microelectronics and Nanometer Structures, Jg. 11 H. 1, S. 108-111Thickness-dependent thin-film resistivity: application of quantitative scanning-tunneling-microscopy imaging
Reiss, Günter ; Hastreiter, E. ; Brückl, Hubert ; Vancea, JohannIn: Physical review B, Jg. 43 H. 6, S. 5176-5179Thickness-dependent effects in the work function of polycrystalline Cu-Films
Vancea, Johann ; Reiss, Günter ; Butz, D. ; Hoffmann, HorstIn: Europhysics letters, Jg. 9 H. 4, S. 379-384Thickness dependence of the work function in double-layer metallic films
Hornauer, Hans ; Vancea, Johann ; Reiss, Günter ; Hoffmann, HorstIn: Zeitschrift für Physik, B: Condensed Matter, Jg. 77 H. 3, S. 399-407The influence of surface roughness on electronic transport in thin films
Reiss, Günter ; Brückl, HubertIn: Surface science, Jg. 269-270, S. 772-776Substrate effects on the surface topography of evaporated gold films: a scanning tunnelling microscopy investigation
Vancea, Johann ; Reiss, Günter ; Schneider, F. ; Bauer, K. ; Hoffmann, HorstIn: Surface science, Jg. 218 H. 1, S. 108-126Spin-torque induced high frequency excitations and switching in spin-valve nanocontacts
Eggeling, Eike Moritz2012Spin dependent transport in continuous and discontinuous CoFeB/MgO heterostructures
Bhutta, Khalid Mehmood2009Simulation von gekoppelten magnetischen Systemen anhand von 3D-Gitterrechnungen
Diplas, Konstantinos2003Sign change in the tunnel magnetoresistance of Fe3O4/MgO/Co-Fe-B magnetic tunnel junctions depending on the annealing temperature and the interface tr [...]
Marnitz, Luca ; Rott, Karsten ; Niehörster, Stefan ; Klewe, Christoph ; Meier, Daniel ; Fabretti, Savio ; Witziok, Matthäus ; Krampf, Andreas ; Kuschel, Olga ; Schemme, Tobias ; Kuepper, Karsten ; Wollschläger, Joachim ; Thomas, Andy ; Reiss, Günter ; Kuschel, TimoIn: AIP Advances, Jg. 5 H. 4