Heitmann, Sonja: Cobalt/Copper multilayers : interplay of microstructure and GMR and recrystallization as the key towards temperature stability. 2004
Inhalt
- Preface
- Interlayer Exchange Coupling
- Giant Magneto-Resistance
- X-Ray Characterization
- Sample Preparation and Characterization Techniques
- Laboratory all-embracing Co/Cu Multilayer Study
- Intention of the Study
- Series and Investigation Overview
- Variation of Spacer Layer Thickness
- Variation of Magnetic Layer Thickness
- Variation of Buffer Layer Thickness
- Variation of Number of Double Layers
- Magnetic Characterization
- Microstructural Characterization
- Discussion of the Double Layer Variation Series
- Conclusions
- From Multilayers to Trilayers
- Temperature Stabilityand Recrystallization
- Intention of the Study
- Investigation Overview
- GMR Characteristics
- Magnetic Characteristics
- Microstructure Characteristics
- Peak Profile Fitting of XRD Scans
- TEM Analysis on Selected Samples
- Multilayer Satellite Analysis
- X-Ray Reflectometry
- Discussion of Magnetoresistive, Magnetic and Microstructural Changes during Annealing
- Elasticity Strain as the Driving Force of Recrystallization
- Conclusion
- Summary
- Appendix
- Useful Relations for X-Rays
- Optical Constants
- Crystal Structures and Powder Diffraction Files
- Co-Cu Binary Phase Diagram
- Bibliography
- Publications and Conferences
- Acknowledgement