Thomas, Andy: Preparation and characterisation of magnetic single and double barrier junctions. 2003
Inhalt
- Basics
- Tunnel magnetoresistance
- Electrical characterisation magnetic tunnel junctions
- Spin polarisation vs. tunnel magneto resistance ratio
- Geometrical enhancement of the TMR value
- Exchange bias
- Analytical and preparation tools
- Transport measurements
- Magnetic characterisation
- Auger Electron Spectroscopy (AES)
- Atomic Force Microscope (AFM)
- X-Ray Diffraction (XRD)
- Optical lithography
- Ion beam milling
- Vacuum furnace
- Single barrier junctions
- Preparation and experimental details
- Unidirectional anisotropy and magnetic properties
- Tunnel barrier formation by ECR plasma oxidation
- Annealing temperature dependence
- Electric excitations in magnetic tunnel junctions
- Noise measurements
- Spin polarisation in ferromagnetic double layer electrodes
- Double barrier junctions
- Preparation by complete oxidation
- Preparation by successive deposition and oxidation
- Copper interlayer
- Summary
- Bibliography