Schmiedeskamp, B. ; Heidemann, B. ; Kleineberg, U. ; Kloidt, A. ; Kühne, M. ; Müller, H. ; Müller, P. ; Nolting, K. ; Heinzmann, Ulrich ; Hoover, Richard B. (Ed.)
In: X-ray EUV optics for astronomy, microscopy, polarimetry, and projection lithography, Vol. 1343, page 64-72
