Electronic transport in metallic films: a tool for scanning tunneling microscopy investigations
Reiss, Günter ; Brückl, HubertIn: Superlattices and Microstructures, Jg. 11 H. 2, S. 171-1741992Electronic transport properties and thickness dependence of the giant magnetoresistance in Co/Cu multilayers
Eckl, Th. ; Reiss, Günter ; Brückl, Hubert ; Hoffmann, HorstIn: Journal of applied physics, Jg. 75 H. 1, S. 362-3671994Electronic transport properties of giant-magnetoresistance Fe/Cr multilayers
Jacob, M. ; Reiss, Günter ; Brückl, Hubert ; Hoffmann, HorstIn: Physical Review, B, Jg. 46 H. 17, S. 11208-112111992Growth and structure of polycrystalline Cr/Au multilayered thin films
Brückl, Hubert ; Vancea, Johann ; Lecheler, R. ; Reiss, Günter ; Hoffmann, HorstIn: Thin solid films, Jg. 250 H. 1-2, S. 56-601994The influence of surface roughness on electronic transport in thin films
Reiss, Günter ; Brückl, HubertIn: Surface science, Jg. 269-270, S. 772-7761992Scanning tunneling microscopy on rough surfaces: quantitative image analysis
Reiss, Günter ; Brückl, Hubert ; Vancea, Johann ; Lecheler, R. ; Hastreiter, E.In: Journal of applied physics, Jg. 70 H. 1, S. 523-5251991Thickness-dependent thin-film resistivity: application of quantitative scanning-tunneling-microscopy imaging
Reiss, Günter ; Hastreiter, E. ; Brückl, Hubert ; Vancea, JohannIn: Physical review B, Jg. 43 H. 6, S. 5176-51791990