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Comment on "Reinterpretation of the thickness-dependent conductivity of thin platinum films"
Vancea, Johann ; Reiss, Günter ; Hoffmann, HorstIn: Journal of Materials Science Letters, Vol. 6 Issue 8, page 985-9861987Electrical conduction in low-resistivity (quasiamorphous) Ag1-xCux alloys
Vancea, Johann ; Pukowietz, S. ; Reiss, Günter ; Hoffmann, HorstIn: Physical Review , B, Vol. 35 Issue 17, page 9067-90721987Electronic transport properties and thickness dependence of the giant magnetoresistance in Co/Cu multilayers
Eckl, Th. ; Reiss, Günter ; Brückl, Hubert ; Hoffmann, HorstIn: Journal of applied physics, Vol. 75 Issue 1, page 362-3671994Electronic transport properties of giant-magnetoresistance Fe/Cr multilayers
Jacob, M. ; Reiss, Günter ; Brückl, Hubert ; Hoffmann, HorstIn: Physical Review, B, Vol. 46 Issue 17, page 11208-112111992Grain boundary resistance in polycrystalline metals
Reiss, Günter ; Vancea, Johann ; Hoffmann, HorstIn: Physical review letters, Vol. 56 Issue 19, page 2100-21031986Growth and structure of polycrystalline Cr/Au multilayered thin films
Brückl, Hubert ; Vancea, Johann ; Lecheler, R. ; Reiss, Günter ; Hoffmann, HorstIn: Thin solid films, Vol. 250 Issue 1-2, page 56-601994Mean-free-path concept in polycrystalline metals
Vancea, Johann ; Reiss, Günter ; Hoffmann, HorstIn: Physical Review , B, Vol. 35 Issue 12, page 6435-64371986Percolation threshold and mean grain size in AlxSi1-x thin films
Reiss, Günter ; Vancea, Johann ; Hoffmann, HorstIn: Journal of Physics, C: Solid State Physics, Vol. 18 Issue 21, page L657-L6601985Resistivity and the Hall effect in polycrystalline Ni-Cu and Ta-Cu multi-layered thin films
Reiss, Günter ; Vancea, Johann ; Kapfberger, Klaus ; Meier, G. ; Hoffmann, HorstIn: Journal of Physics, Condensed Matter, Vol. 1 Issue 7, page 1275-12831989Scanning tunneling microscopy on rough surfaces: deconvolution of constant current images
Reiss, Günter ; Schneider, F. ; Vancea, Johann ; Hoffmann, HorstIn: Applied physics letters, Vol. 57 Issue 9, page 867-8691990Scanning tunneling microscopy on rough surfaces: tip-shape-limited resolution
Reiss, Günter ; Vancea, Johann ; Wittmann, H. ; Zweck, Josef ; Hoffmann, HorstIn: Journal of applied physics, Vol. 67 Issue 3, page 1156-11591990Scanning tunneling potentiometry (STP) studies of gold islands on a thin carbon film
Besold, J. ; Reiss, Günter ; Hoffmann, HorstIn: Applied surface science, Vol. 65-66, page 23-271993Substrate effects on the surface topography of evaporated gold films: a scanning tunnelling microscopy investigation
Vancea, Johann ; Reiss, Günter ; Schneider, F. ; Bauer, K. ; Hoffmann, HorstIn: Surface science, Vol. 218 Issue 1, page 108-1261989Thickness dependence of the work function in double-layer metallic films
Hornauer, Hans ; Vancea, Johann ; Reiss, Günter ; Hoffmann, HorstIn: Zeitschrift für Physik, B: Condensed Matter, Vol. 77 Issue 3, page 399-4071989Thickness-dependent effects in the work function of polycrystalline Cu-Films
Vancea, Johann ; Reiss, Günter ; Butz, D. ; Hoffmann, HorstIn: Europhysics letters, Vol. 9 Issue 4, page 379-3841989