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Bechstein, Ralf
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Kühnle, Angelika
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Rahe, Philipp
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Clear Signature of the (2 x 1) Reconstruction of Calcite (1014)
Schütte, Jens
;
Rahe, Philipp
;
Tröger, Lutz
;
Rode, Sebastian
;
Bechstein, Ralf
;
Reichling, Michael
;
Kühnle, Angelika
In: Langmuir, Vol. 26 Issue 11, page 8295-8300
2010
Controlling Molecular Self-Assembly on an Insulating Surface by Rationally Designing an Efficient Anchor Functionality That Maintains Structural Flexi [...]
Hauke, Christopher M.
;
Bechstein, Ralf
;
Kittelmann, Markus
;
Storz, Christof
;
Kilbinger, Andreas F. M.
;
Rahe, Philipp
;
Kühnle, Angelika
In: ACS Nano, Vol. 7 Issue 6, page 5491-5498
2013
Imaging perylene derivatives on rutile TiO2(110) by noncontact atomic force microscopy
Schütte, Jens
;
Bechstein, Ralf
;
Rahe, Philipp
;
Rohlfing, Michael
;
Kühnle, Angelika
;
Langhals, Heinz
In: Physical Review B, Vol. 79 Issue 4, page 045428 et seq.
2009
Repulsive interaction and contrast inversion in noncontact atomic force microscopy imaging of adsorbates
Rahe, Philipp
;
Bechstein, Ralf
;
Schütte, Jens
;
Ostendorf, Frank
;
Kühnle, Angelika
In: Physical Review B, Vol. 77 Issue 19, page 195410 et seq.
2008
Single-molecule switching with non-contact atomic force microscopy
Schütte, Jens
;
Bechstein, Ralf
;
Rahe, Philipp
;
Langhals, Heinz
;
Rohlfing, Michael
;
Kühnle, Angelika
In: Nanotechnology, Vol. 22 Issue 24
2011
Substrate Templating Guides the Photoinduced Reaction of C-60 on Calcite
Lindner, Robert
;
Rahe, Philipp
;
Kittelmann, Markus
;
Gourdon, Andre
;
Bechstein, Ralf
;
Kühnle, Angelika
In: Angewandte Chemie. International Edition, Vol. 53 Issue 30, page 7952-7955
2014
Vertical and lateral drift corrections of scanning probe microscopy images
Rahe, Philipp
;
Bechstein, Ralf
;
Kühnle, Angelika
In: Journal of Vacuum Science & Technology B, Vol. 28 Issue 3, page C4E31 et seq.
2010
The weight function for charges-A rigorous theoretical concept for Kelvin probe force microscopy
Söngen, Hagen
;
Rahe, Philipp
;
Neff, Julia L.
;
Bechstein, Ralf
;
Ritala, Juha
;
Foster, Adam S.
;
Kühnle, Angelika
In: Journal of Applied Physics, Vol. 119 Issue 2, page 25304 et seq.
2016