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1901-2000
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Heinzmann, Ulrich
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Schmiedeskamp, B.
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Heidemann, B.
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Hopfe, S.
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Kessler, B.
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Kleineberg, U.
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Kloidt, A.
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Müller, Norbert
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Scholz, R.
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Stock, H. J.
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Tappe, T.
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Identification of Xe interface states in the Xe(111)/Pt(111) system by spin-resolved photoelectron spectroscopy
Kessler, B.
;
Müller, Norbert
;
Schmiedeskamp, B.
;
Heinzmann, Ulrich
In: Solid State Communications, Vol. 90 Issue 8, page 523-526
1994
Interface Stability and Silicide Formation in High Temperature Stable MoxSi1-x/Si Multilayer Soft X-Ray Mirrors Studied by Means of X-Ray Diffraction and [...]
Kleineberg, U.
;
Stock, H. J.
;
Kloidt, A.
;
Schmiedeskamp, B.
;
Heinzmann, Ulrich
;
Hopfe, S.
;
Scholz, R.
In: Physica status solidi A: applications and materials science, Vol. 145 Issue 2, page 539-550
1994
Interlayer composition and interface stability in Mo/Si multilayers studied with high-resolution RBS
Heidemann, B.
;
Tappe, T.
;
Schmiedeskamp, B.
;
Heinzmann, Ulrich
In: Applied Surface Science, Vol. 78 Issue 2, page 133-140
1994