Scanning tunneling potentiometry (STP) studies of gold islands on a thin carbon film
Besold, J. ; Reiss, Günter ; Hoffmann, HorstIn: Applied surface science, Jg. 65-66, S. 23-271993Growth and structure of polycrystalline Cr/Au multilayered thin films
Brückl, Hubert ; Vancea, Johann ; Lecheler, R. ; Reiss, Günter ; Hoffmann, HorstIn: Thin solid films, Jg. 250 H. 1-2, S. 56-601994On/off switching of bit readout in bias-enhanced tunnel magneto-Seebeck effect
Böhnke, Alexander ; Milnikel, Marius ; von der Ehe, Marvin ; Franz, Christian ; Zbarsky, Vladyslav ; Czerner, Michael ; Rott, Karsten ; Thomas, Andy ; Heiliger, Christian ; Reiss, Günter ; Münzenberg, MarkusIn: Scientific Reports, Jg. 5 H. 12015Electronic transport properties and thickness dependence of the giant magnetoresistance in Co/Cu multilayers
Eckl, Th. ; Reiss, Günter ; Brückl, Hubert ; Hoffmann, HorstIn: Journal of applied physics, Jg. 75 H. 1, S. 362-3671994Thickness dependence of the work function in double-layer metallic films
Hornauer, Hans ; Vancea, Johann ; Reiss, Günter ; Hoffmann, HorstIn: Zeitschrift für Physik, B: Condensed Matter, Jg. 77 H. 3, S. 399-4071989Electronic transport properties of giant-magnetoresistance Fe/Cr multilayers
Jacob, M. ; Reiss, Günter ; Brückl, Hubert ; Hoffmann, HorstIn: Physical Review, B, Jg. 46 H. 17, S. 11208-112111992Quantitative separation of the anisotropic magnetothermopower and planar Nernst effect by the rotation of an in-plane thermal gradient
Reimer, Oliver ; Meier, Daniel ; Bovender, Michel ; Helmich, Lars ; Dreessen, Jan-Oliver ; Krieft, Jan ; Shestakov, Anatoly S. ; Back, Christian H. ; Schmalhorst, Jan-Michael ; Hütten, Andreas ; Reiss, Günter ; Kuschel, TimoIn: Scientific Reports, Jg. 7 H. 12017Scanning tunneling microscopy on rough surfaces: quantitative image analysis
Reiss, Günter ; Brückl, Hubert ; Vancea, Johann ; Lecheler, R. ; Hastreiter, E.In: Journal of applied physics, Jg. 70 H. 1, S. 523-5251991Thickness-dependent thin-film resistivity: application of quantitative scanning-tunneling-microscopy imaging
Reiss, Günter ; Hastreiter, E. ; Brückl, Hubert ; Vancea, JohannIn: Physical review B, Jg. 43 H. 6, S. 5176-51791990Scanning tunneling microscopy on rough surfaces: deconvolution of constant current images
Reiss, Günter ; Schneider, F. ; Vancea, Johann ; Hoffmann, HorstIn: Applied physics letters, Jg. 57 H. 9, S. 867-8691990Grain boundary resistance in polycrystalline metals
Reiss, Günter ; Vancea, Johann ; Hoffmann, HorstIn: Physical review letters, Jg. 56 H. 19, S. 2100-21031986Percolation threshold and mean grain size in AlxSi1-x thin films
Reiss, Günter ; Vancea, Johann ; Hoffmann, HorstIn: Journal of Physics, C: Solid State Physics, Jg. 18 H. 21, S. L657-L6601985